Title :
Statistical Properties of SPECT MAP Reconstruction Incorporating Window Based Scatter Correction
Author :
Kulkarni, Santosh ; Khurd, Parmeshwar ; Zhou, Lili ; Gindi, Gene
Author_Institution :
Dept. of Electr. & Comput. Eng., Stony Brook Univ., Stony Brook, NY
Abstract :
In SPECT, the sinogram contains scatter counts that degrade the reconstructed image quality. We develop theoretical expressions to predict the reconstructed mean, covariance, and local point-spread function for SPECT MAP (maximum a posteriori) reconstructions. These expressions apply to window-based scatter correction methods, such as the triple-energy-window method, where the scatter correction is incorporated directly into the forward imaging model as an affine term. In addition this forward imaging model is incorporated directly in the MAP objective. We model a scatter estimate as a noisy quantity so that the reconstruction is driven by both photon noise in the photopeak and the noise in the scatter estimate. We use sample reconstruction methods to validate our theoretical expressions. We compare the speed of our theoretical methods to that of methods based on sample reconstructions. Such theoretical formulae could be used to rapidly assess the impact of different scatter correction strategies on image quality.
Keywords :
image reconstruction; maximum likelihood estimation; optical transfer function; single photon emission computed tomography; SPECT MAP reconstruction; forward imaging model; maximum a posteriori reconstructions; photon noise; point-spread function; statistical properties; triple-energy-window method; window based scatter correction; Attenuation; Degradation; Electromagnetic scattering; Energy resolution; Image quality; Image reconstruction; Particle scattering; Reconstruction algorithms; Satellite broadcasting; Single photon emission computed tomography; Image quality; maximum a posteriori image reconstruction; scatter correction; single photon emission computed tomography; triple energy window method;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2006168