DocumentCode :
1157273
Title :
Basic Performance Test of a Prototype PET Scanner Using CdTe Semiconductor Detectors
Author :
Ueno, Y. ; Morimoto, Y. ; Tsuchiya, K. ; Yanagita, N. ; Kojima, S. ; Ishitsu, T. ; Kitaguchi, H. ; Kubo, N. ; Zhao, S. ; Tamaki, N. ; Amemiya, K.
Author_Institution :
Central Res. Lab., Hitachi, Ltd., Hitachi
Volume :
56
Issue :
1
fYear :
2009
Firstpage :
24
Lastpage :
28
Abstract :
A prototype positron emission tomography (PET) scanner using CdTe semiconductor detectors was developed, and its initial evaluation was conducted. The scanner was configured to form a single detector ring with six separated detector units, each having 96 detectors arranged in three detector layers. The field of view (FOV) size was 82 mm in diameter. Basic physical performance indicators of the scanner were measured through phantom studies and confirmed by rat imaging. The system-averaged energy resolution and timing resolution were 5.4% and 6.0 ns (each in FWHM) respectively. Spatial resolution measured at FOV center was 2.6 mm FWHM. Scatter fraction was measured and calculated in a National Electrical Manufacturers Association (NEMA)-fashioned manner using a 3-mm diameter hot capillary in a water-filled 80-mm diameter acrylic cylinder. The calculated result was 3.6%. Effect of depth of interaction (DOI) measurement was demonstrated by comparing hot-rod phantom images reconstructed with and without DOI information. Finally, images of a rat myocardium and an implanted tumor were visually assessed, and the imaging performance was confirmed.
Keywords :
phantoms; positron emission tomography; semiconductor counters; tumours; CdTe semiconductor detectors; FOV center; FWHM; NEMA; National Electrical Manufacturers Association; acrylic cylinder; hot-rod phantom images; implanted tumor; prototype PET scanner; prototype positron emission tomography; rat imaging; rat myocardium; size 82 mm; time 6 ns; Detectors; Electric variables measurement; Energy resolution; Imaging phantoms; Positron emission tomography; Prototypes; Scattering; Semiconductor device testing; Spatial resolution; Timing; CdTe; DOI; PET; semiconductor detector;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.2004804
Filename :
4782180
Link To Document :
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