DocumentCode :
1157393
Title :
Evolution of Perpendicular Recording Media Grains on Carbon-Based Synthetic Nucleation Layer
Author :
Piramanayagam, S.N. ; Srinivasan, Kumar ; Tan, H.K. ; Lim, B.C. ; Wong, S.K.
Author_Institution :
Data Storage Inst., Agency for Sci. Technol. & Res., Singapore
Volume :
45
Issue :
2
fYear :
2009
Firstpage :
793
Lastpage :
798
Abstract :
Perpendicular recording media, where the recording layer is deposited on carbon-based synthetic nucleation (SN) layers, have been investigated for magnetic and microstructural properties. It was observed that the recording layers deposited directly on low-pressure sputtered Ru layers with and without an SN layer showed a similar microstructure from plan-view TEM images. However, the magnetic properties of the media with SN layer show better intergranular segregation, whereas the media without SN layer show signs of strong intergranular exchange coupling. Recording layer thickness dependent studies indicate that the 3-nm-thick recording layer deposited on the Ru layer directly without SN layer showed rectangular hysteresis loop, indicating the formation of a continuous layer. A recording layer (3 nm) deposited on an SN layer showed a superparamagnetic type of hysteresis loop, indicating better intergranular segregation. Transmission electron microscopy observations also indicate that the recording layer deposited on SN layer shows better segregated structure even at 3 nm. The results indicate that SN layer is beneficial for grain size reduction as well as eliminating the initial continuous layer formed in the recording layer.
Keywords :
carbon; exchange interactions (electron); grain size; magnetic hysteresis; nucleation; perpendicular magnetic recording; segregation; sputtered coatings; superparamagnetism; transmission electron microscopy; C; TEM images; carbon-based synthetic nucleation layer; grain size reduction; intergranular exchange coupling; intergranular segregation; magnetic hysteresis loop; magnetic properties; microstructural properties; perpendicular recording media; recording layer thickness; sputtered layers; superparamagnetism; transmission electron microscopy; Microstructure; perpendicular recording; recording media; synthetic nucleation layers;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2008.2010632
Filename :
4782194
Link To Document :
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