DocumentCode
1157396
Title
Wide dynamic range CMOS image sensor with pixel level ADC
Author
Rhee, Jehyuk ; Joo, Youngjoong
Author_Institution
Dept. of Electron. Eng., Arizona State Univ., Tempe, AZ, USA
Volume
39
Issue
4
fYear
2003
fDate
2/20/2003 12:00:00 AM
Firstpage
360
Lastpage
361
Abstract
A new enhanced dynamic range (DR) and signal-to-noise ratio (SNR) CMOS imaging system with a pixel level analogue-to-digital converter (ADC) is presented. The proposed reset technique and time-to-digital converter increases DR and peak SNR simultaneously. The circuit reuse concept is also proposed to increase the fill factor.
Keywords
CMOS image sensors; analogue-digital conversion; integrated circuit noise; readout electronics; CMOS image sensor; analogue-to-digital converter; circuit reuse concept; enhanced SNR imaging system; enhanced dynamic range imaging system; fill factor improvement; peak SNR; pixel level ADC; reset technique; signal-to-noise ratio; time-to-digital converter; wide dynamic range imager;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20030246
Filename
1184066
Link To Document