Title :
Wide dynamic range CMOS image sensor with pixel level ADC
Author :
Rhee, Jehyuk ; Joo, Youngjoong
Author_Institution :
Dept. of Electron. Eng., Arizona State Univ., Tempe, AZ, USA
fDate :
2/20/2003 12:00:00 AM
Abstract :
A new enhanced dynamic range (DR) and signal-to-noise ratio (SNR) CMOS imaging system with a pixel level analogue-to-digital converter (ADC) is presented. The proposed reset technique and time-to-digital converter increases DR and peak SNR simultaneously. The circuit reuse concept is also proposed to increase the fill factor.
Keywords :
CMOS image sensors; analogue-digital conversion; integrated circuit noise; readout electronics; CMOS image sensor; analogue-to-digital converter; circuit reuse concept; enhanced SNR imaging system; enhanced dynamic range imaging system; fill factor improvement; peak SNR; pixel level ADC; reset technique; signal-to-noise ratio; time-to-digital converter; wide dynamic range imager;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030246
