Title :
Expert systems tactics in testing FASTBUS segment interconnect modules (lessons so far in the SIDES project)
Author :
Knowles, R.N. ; Forster, R. ; Ho, N. ; Kroma, J.
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
fDate :
10/1/1989 12:00:00 AM
Abstract :
The FASTBUS segment interconnect (SI) module, which is among the most complex modules to diagnose and repair, is an intermediary device that provides a temporary connection between two otherwise independent FASTBUS segments. Internal SI problems typically manifest themselves elsewhere within the segments served. Offline testing of this sophisticated device is equally challenging. To address these problems, an exploratory project called the Segment Interconnect Diagnostic Expert System (SIDES) has been launched. The goals are to evaluate the technology and to create a more effective and streamlined testing schema. Some of the issues which have arisen during the initial phases of this project are presented
Keywords :
computer equipment testing; computer interfaces; expert systems; FASTBUS segment interconnect modules; Segment Interconnect Diagnostic Expert System; Backplanes; Computer interfaces; Diagnostic expert systems; Expert systems; Face detection; Fastbus; Instruments; Laboratories; Life estimation; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on