Analysis of Surface Roughness Heterogeneity and Scattering Behavior for Radar Measurements

The use of a theoretical backscatter model to analyze medium to low spatial resolution microwave data is still very complicated, particularly because of the difficulty in defining a unique roughness parameter, capable of adequately representing heterogeneous terrain. In this paper, an approach is proposed for roughness analysis and the modeling of backscattering, under conditions of surface heterogeneity. This paper is based on the use of a semiempirical backscattering model, defined with a single roughness parameter Zs=s²/l (s being the root mean square surface height and l the correlation length). The proposed backscattering model has been validated with integral equation model simulations, for high radar incidence angles, and within its domain of roughness validity. A range of experimental measurements was used to validate the model expressions. The effective low spatial resolution roughness, inferred from signals backscattered from a surface of heterogeneous roughness, is defined for different roughness classes