• DocumentCode
    1159364
  • Title

    Crosstalk and microlens study in a color CMOS image sensor

  • Author

    Agranov, Gennadiy ; Berezin, Vladimir ; Tsai, Richard H.

  • Author_Institution
    Micron Technol. Inc., Pasadena, CA, USA
  • Volume
    50
  • Issue
    1
  • fYear
    2003
  • fDate
    1/1/2003 12:00:00 AM
  • Firstpage
    4
  • Lastpage
    11
  • Abstract
    The paper describes results of crosstalk investigations and microlens (μ-lens) scan experiments in a color CMOS image sensor with active pixel structure . The investigation of optical and electrical crosstalk was made on 7.8- and 5.6-μm pixels by using samples with continuous shift of color filter (CF ) and μ-lens across the array. As a result of this investigation, the distribution of sensitivity inside a pixel has been determined. By using minimum crosstalk criteria, the optimum parameters of the μ-lens manufacturing process and optimum position of the μ-lens was determined. The paper presents color maps of pixel sensitivity and crosstalk criteria as well as snapshots illustrating sensitivity distribution and collection area. The paper presents spectral characteristics measured at different relative apertures (f-number) as well. The quantitative analysis of spectral responses allowed us to determine the contribution of each component to the overall crosstalk.
  • Keywords
    CMOS image sensors; crosstalk; image colour analysis; microlenses; 5.6 micron; 7.8 micrometre; active pixel structure; collection area; color CMOS image sensor; continuous shift; electrical crosstalk; microlens; optical crosstalk; sensitivity; sensitivity distribution; spectral characteristics; Apertures; CMOS image sensors; Lenses; Manufacturing processes; Microoptics; Optical arrays; Optical crosstalk; Optical filters; Optical sensors; Pixel;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.806473
  • Filename
    1185156