DocumentCode
1159364
Title
Crosstalk and microlens study in a color CMOS image sensor
Author
Agranov, Gennadiy ; Berezin, Vladimir ; Tsai, Richard H.
Author_Institution
Micron Technol. Inc., Pasadena, CA, USA
Volume
50
Issue
1
fYear
2003
fDate
1/1/2003 12:00:00 AM
Firstpage
4
Lastpage
11
Abstract
The paper describes results of crosstalk investigations and microlens (μ-lens) scan experiments in a color CMOS image sensor with active pixel structure . The investigation of optical and electrical crosstalk was made on 7.8- and 5.6-μm pixels by using samples with continuous shift of color filter (CF ) and μ-lens across the array. As a result of this investigation, the distribution of sensitivity inside a pixel has been determined. By using minimum crosstalk criteria, the optimum parameters of the μ-lens manufacturing process and optimum position of the μ-lens was determined. The paper presents color maps of pixel sensitivity and crosstalk criteria as well as snapshots illustrating sensitivity distribution and collection area. The paper presents spectral characteristics measured at different relative apertures (f-number) as well. The quantitative analysis of spectral responses allowed us to determine the contribution of each component to the overall crosstalk.
Keywords
CMOS image sensors; crosstalk; image colour analysis; microlenses; 5.6 micron; 7.8 micrometre; active pixel structure; collection area; color CMOS image sensor; continuous shift; electrical crosstalk; microlens; optical crosstalk; sensitivity; sensitivity distribution; spectral characteristics; Apertures; CMOS image sensors; Lenses; Manufacturing processes; Microoptics; Optical arrays; Optical crosstalk; Optical filters; Optical sensors; Pixel;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2002.806473
Filename
1185156
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