• DocumentCode
    1159438
  • Title

    An enhanced-performance CMOS imager with a flushed-reset photodiode pixel

  • Author

    Pain, Bedabrata ; Yang, Guang ; Cunningham, Thomas J. ; Wrigley, Chris ; Hancock, Bruce

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    50
  • Issue
    1
  • fYear
    2003
  • fDate
    1/1/2003 12:00:00 AM
  • Firstpage
    48
  • Lastpage
    56
  • Abstract
    A new front-end for photodiode-based CMOS imagers is presented. Degradation in imaging performance due to conventional hard- and soft-reset of pixels is analyzed. To overcome these limitations, the design and operation of a flushed-reset pixel is described. The flushed-reset pixel combines the best of hard- and soft-reset to simultaneously provide excellent radiometric accuracy, high linearity, no image lag, high saturation level, and reduced read-noise. The new front-end is implemented by changes to the column-circuitry only, leaving the pixel unchanged, preventing degradation of any unrelated imaging performance. It is compatible with large format imager implementation, has minimal impact on the frame-rate, and does not introduce any additional hot-carrier stress in the pixel. Data from a large format (5122) imager demonstrates the efficacy of the flushed-reset pixel approach.
  • Keywords
    CMOS image sensors; hot carriers; integrated circuit noise; photodiodes; CMOS imager; column-circuitry; flushed-reset photodiode pixel; hot-carrier stress; large format imager; linearity; radiometric accuracy; read-noise; saturation level; soft-reset; Circuit testing; Degradation; Diodes; FETs; Linearity; Noise level; Noise reduction; Photodiodes; Pixel; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.806969
  • Filename
    1185162