• DocumentCode
    1159555
  • Title

    Comparison between epi-down and epi-up bonded high-power single-mode 980-nm semiconductor lasers

  • Author

    Liu, Xingsheng ; Hu, Martin Hai ; Nguyen, Hong Ky ; Caneau, Catherine G. ; Rasmussen, Michael Heath ; Davis, Ronald W., Jr. ; Zah, Chung-en

  • Author_Institution
    Corning Inc., USA
  • Volume
    27
  • Issue
    4
  • fYear
    2004
  • Firstpage
    640
  • Lastpage
    646
  • Abstract
    Epi-down and epi-up bonded high-power single-mode 980-nm lasers have been studied in terms of bonding process, thermal behavior, optical performances, and long-term laser reliability. We demonstrated that epi-down bonding can offer lower thermal resistance and improved optical performance without degrading the long-term laser reliability. An optical power of 630 mW was obtained for the first time from an epi-down bonded 980-nm pump module. Our studies have shown that epi-down bonding of single-mode 980-nm lasers can reduce junction temperature and thermal resistance by up to 30%. Experimental measurements showed over 20% in thermal rollover power improvement and over 25% reduction in wavelength shift versus current in epi-down mounted lasers compared to epi-up mounted lasers. Lifetime test over 14 000 h at 500 mA and 80°C of the epi-down bonded lasers is reported for the first time.
  • Keywords
    bonding processes; laser reliability; life testing; semiconductor lasers; thermal management (packaging); thermal stresses; 500 mA; 630 mW; 80 C; 980 nm; bonding process; epi-down bonding; epi-down mounted lasers; epi-up mounted lasers; junction temperature; laser reliability; optical performances; pump laser; pump module; semiconductor lasers; thermal behavior; thermal management; thermal resistance; thermal stress; wavelength shift; Bonding processes; Current measurement; Electrical resistance measurement; Optical pumping; Power lasers; Pump lasers; Semiconductor lasers; Temperature; Thermal degradation; Thermal resistance; 65; Epi-down bonding; pump laser; reliability; semiconductor laser; thermal management; thermal stress;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2004.831862
  • Filename
    1356006