DocumentCode
1159641
Title
Ag-GaP Schottky photodiodes for UV sensors
Author
Pikhtin, Alexander N. ; Tarasov, Sergey A. ; Kloth, Bernd
Author_Institution
Dept. of Microelectron., St. Petersburg State Electrotech. Univ., Russia
Volume
50
Issue
1
fYear
2003
fDate
1/1/2003 12:00:00 AM
Firstpage
215
Lastpage
217
Abstract
We created UV-sensitive photodiodes based on a GaP Schottky barrier. A revised value of the Ag-GaP barrier height (1.55±0.03 eV) has been determined, and this value is much larger than commonly used for this system. Moreover, it depends on the parameters of the dielectric spacer and may be up to 1.7 eV. The high Schottky barrier improves the characteristics of photodetectors. We developed two types of such photodetectors. The first one is a selective UV photodiode with λmax=0.32 μm, Δλ=15 nm, and S=0.034 A/W based on the selective transparency of silver. The second one is a broad-band with λmax=0.42 μm, Δλ=230 nm, and S=0.19 A/W.
Keywords
III-V semiconductors; Schottky diodes; dark conductivity; gallium compounds; photodiodes; semiconductor-metal boundaries; silver; ultraviolet detectors; 0.32 micron; 0.42 micron; 1.55 to 1.7 eV; Ag-GaP; Ag-GaP Schottky photodiodes; Ag-GaP barrier height; GaP Schottky barrier; UV sensors; UV-sensitive photodiodes; broad-band photodetector; dark current; dielectric spacer parameters; narrow spectral characteristics; selective UV photodiode; selective transparency; wide spectral characteristics; Dielectrics; Epitaxial growth; Fabrication; Optical filters; Photodetectors; Photodiodes; Schottky barriers; Silicon; Silver; Sputtering;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2002.807247
Filename
1185184
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