• DocumentCode
    1159641
  • Title

    Ag-GaP Schottky photodiodes for UV sensors

  • Author

    Pikhtin, Alexander N. ; Tarasov, Sergey A. ; Kloth, Bernd

  • Author_Institution
    Dept. of Microelectron., St. Petersburg State Electrotech. Univ., Russia
  • Volume
    50
  • Issue
    1
  • fYear
    2003
  • fDate
    1/1/2003 12:00:00 AM
  • Firstpage
    215
  • Lastpage
    217
  • Abstract
    We created UV-sensitive photodiodes based on a GaP Schottky barrier. A revised value of the Ag-GaP barrier height (1.55±0.03 eV) has been determined, and this value is much larger than commonly used for this system. Moreover, it depends on the parameters of the dielectric spacer and may be up to 1.7 eV. The high Schottky barrier improves the characteristics of photodetectors. We developed two types of such photodetectors. The first one is a selective UV photodiode with λmax=0.32 μm, Δλ=15 nm, and S=0.034 A/W based on the selective transparency of silver. The second one is a broad-band with λmax=0.42 μm, Δλ=230 nm, and S=0.19 A/W.
  • Keywords
    III-V semiconductors; Schottky diodes; dark conductivity; gallium compounds; photodiodes; semiconductor-metal boundaries; silver; ultraviolet detectors; 0.32 micron; 0.42 micron; 1.55 to 1.7 eV; Ag-GaP; Ag-GaP Schottky photodiodes; Ag-GaP barrier height; GaP Schottky barrier; UV sensors; UV-sensitive photodiodes; broad-band photodetector; dark current; dielectric spacer parameters; narrow spectral characteristics; selective UV photodiode; selective transparency; wide spectral characteristics; Dielectrics; Epitaxial growth; Fabrication; Optical filters; Photodetectors; Photodiodes; Schottky barriers; Silicon; Silver; Sputtering;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.807247
  • Filename
    1185184