• DocumentCode
    1159704
  • Title

    A novel InGaP/InGaAs/GaAs double /spl delta/-doped pHEMT with camel-like gate structure

  • Author

    Jung-Hui Tsai

  • Author_Institution
    Dept. of Phys., Nat. Kaohsiung Normal Univ., Taiwan
  • Volume
    24
  • Issue
    1
  • fYear
    2003
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The author reports a novel InGaP/InGaAs/GaAs double delta-doped pseudomorphic high-electron mobility transistor (pHEMT) with n/sup +/-GaAs/p/sup +/-InGaP/n-InGaP camel-like gate structure grown by MOCVD. Due to the p-n depletion from the p/sup +/-InGaP gate to the channel region and the presence of /spl Delta/Ec at the InGaP/InGaAs heterostructure, the turn-on voltage of gate is larger than 1.7 V. For a 1×100-μm2 device, the experimental results show an extrinsic transconductance of 107 mS/mm and a saturation current density of 850 mA/mm. Significantly, an extremely broad gate voltage swing larger than 6 V with above 80% maximum g/sub m/ is obtained. Furthermore, the unit current cut-off frequency fT and maximum oscillation frequency are up to 20 and 32 GHz, respectively. The excellent device performance provides a promise for linear and large signal amplifiers and high-frequency circuit applications.
  • Keywords
    III-V semiconductors; MOCVD; current density; doping profiles; gallium arsenide; gallium compounds; high electron mobility transistors; indium compounds; microwave field effect transistors; 1.7 V; 107 mS/mm; 20 GHz; 32 GHz; InGaP-InGaAs-GaAs; InGaP/InGaAs/GaAs pHEMT; MOCVD growth; broad-plateau transconductance; double /spl delta/-doped PHEMT; double delta-doped pHEMT; gate turn-on voltage; high current density; high-frequency circuit applications; large signal amplifiers; linear signal amplifiers; maximum oscillation frequency; n/sup +/-GaAs/p/sup +/-InGaP/n-InGaP camel-like gate structure; pseudomorphic HEMT; unit current cutoff frequency; Current density; Cutoff frequency; Gallium arsenide; HEMTs; Indium gallium arsenide; MOCVD; MODFETs; PHEMTs; Transconductance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2002.807024
  • Filename
    1185191