Title :
Monolithically Integrated Enhancement/Depletion-Mode AlGaN/GaN HEMT Inverters and Ring Oscillators Using

Plasma Treatment
Author :
Cai, Yong ; Cheng, Zhiqun ; Tang, Wilson Chak Wah ; Lau, Kei May ; Chen, Kevin J.
Author_Institution :
Dept. of Phys., Hong Kong Univ. of Sci. & Technol., Kowloon
Abstract :
Fabrication and characterization of AlGaN/GaN HEMT inverters and ring oscillators utilizing integrated enhancement/depletion-mode (E/D-mode) AlGaN/GaN HEMTs are presented. The core technique is a CF4 plasma treatment that can effectively convert a D-mode AlGaN/GaN heterostructure to an E-mode heterostructure. A significant advantage of the plasma-treated E-mode HEMTs is that the gate current is reduced in both reverse- and forward-bias regions due to the effectively enhanced barrier height induced by the negatively charged fluorine ions in the AlGaN barrier. As a result, the input voltage swing is expanded by about 1 V for the E-mode HEMT, enabling convenient input/output logic level matching for multistage logic circuits such as ring oscillators. The fabricated 17-stage direct-coupled field-effect transistor logic ring oscillator using the 1-mum-gate technology can operate properly at a larger supply voltage of 3.5 V, and a minimum propagation delay of 130 ps/stage is achieved
Keywords :
HEMT integrated circuits; III-V semiconductors; aluminium compounds; gallium compounds; invertors; oscillators; plasma materials processing; wide band gap semiconductors; 1 micron; 3.5 V; AlGaN-GaN; CF4; HEMT inverters; RTA; direct-coupled field-effect transistor; enhancement-depletion mode; fluorine ions; gate current; gate technology; logic level matching; multistage logic circuits; plasma treatment; post-gate rapid thermal annealing; ring oscillators; Aluminum gallium nitride; Fabrication; Gallium nitride; HEMTs; Impedance matching; Inverters; Logic circuits; Plasmas; Ring oscillators; Voltage-controlled oscillators; AlGaN/GaN; HEMT; depletion mode (D-mode); direct-coupled field-effect transistor (FET) logic (DCFL); enhancement mode (E-mode); enhancement/depletion (E/D) inverter; fluorine ions; gate current; plasma treatment; post-gate rapid thermal annealing (RTA); ring oscillator;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.881002