DocumentCode :
1160081
Title :
Stability criterion for lateral inhibition and related networks that is robust in the presence of integrated circuit parasitics
Author :
Standley, David L. ; Wyatt, John L., Jr.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume :
36
Issue :
5
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
675
Lastpage :
681
Abstract :
In the analog VLSI implementation of neural systems, it is sometimes convenient to build lateral inhibition networks by using a locally connected on-chip resistive grid. A serious problem of unwanted spontaneous oscillation often arises with these circuits and renders them unusable in practice. A design approach is reported that guarantees such a system will be stable, even though the values of designed elements in the resistive grid may be imprecise and the location and values of parasitic elements may be unknown. The method is based on a mathematical analysis using Tellegen´s theorem and the Popov criterion. The criteria are local in the sense that no overall analysis of the interconnected system is required for their use, empirical in the sense that they involve only measurable frequency response data on the individual cells, and robust in the sense that they are not affected by unmodeled parasitic resistances and capacitances in the interconnect network
Keywords :
VLSI; linear integrated circuits; neural nets; stability criteria; Popov criterion; Tellegen´s theorem; analog VLSI implementation; integrated circuit parasitics; interconnect network; lateral inhibition networks; locally connected on-chip resistive grid; parasitic capacitances; parasitic resistances; robust stability criterion; unwanted spontaneous oscillation; Capacitance measurement; Circuit stability; Electrical resistance measurement; Frequency measurement; Interconnected systems; Mathematical analysis; Network-on-a-chip; Stability criteria; System-on-a-chip; Very large scale integration;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/31.31315
Filename :
31315
Link To Document :
بازگشت