Title :
Bounds and analysis of aliasing errors in linear feedback shift registers
Author :
Williams, Thomas W. ; Daehn, Wilfried ; Gruetzner, Matthias ; Starke, Cordt W.
Author_Institution :
IBM, Boulder, CO, USA
fDate :
1/1/1988 12:00:00 AM
Abstract :
Aliasing errors in linear feedback shift registers (LFSRs) used as signature analysis registers in self-testing networks are considered. A bound on aliasing is established by a straightforward algebraic analysis of LFSRs. It is calculated as a function of p, the probability of an error occurring at an output of the network under test. This bound is robust but is only good for p close to 1/2. To investigate the question of what happens to aliasing errors in general, the function of LFSRs is modeled by a Markov process and a solution is obtained by the z-transform. It is shown that for p>1/2 the aliasing probability for primitive polynomials converges much faster to the final steady-state value than for nonprimitive polynomials. For values of p<1/2, aliasing probability for primitive polynomials is always less than for nonprimitive ones. These results indicate that, in general, primitive polynomials are much better with respect to aliasing than nonprimitive polynomials. Simulation results for aliasing errors for these polynomials give insight to how aliasing occurs
Keywords :
Markov processes; Z transforms; error statistics; logic analysers; shift registers; LFSRs; Markov process; aliasing errors; bound; linear feedback shift registers; nonprimitive polynomials; primitive polynomials; self-testing networks; signature analysis registers; z-transform; Built-in self-test; Error analysis; Error probability; Intelligent networks; Linear feedback shift registers; Markov processes; Polynomials; Robustness; Shift registers; Testing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on