DocumentCode :
1160410
Title :
A sophomore capstone course in measurement and automated data acquisition
Author :
DeLyser, Ronald R. ; Quine, Richard W. ; Rullkoetter, Paul J. ; Armentrout, Daniel L.
Author_Institution :
Dept. of Eng., Univ. of Denver, CO, USA
Volume :
47
Issue :
4
fYear :
2004
Firstpage :
453
Lastpage :
458
Abstract :
A novel multidisciplinary course (Engineering Applications III) was developed that integrates knowledge gained and tools acquired from the introductory freshman circuits, mechanics, and C/C++ courses. It is built around the concepts associated with automated data acquisition systems. This three-quarter-hour, laboratory-intensive course uses a suite of data acquisition equipment located in the computer aided teaching laboratory at the University of Denver, Denver, CO. The presentation format is two lectures and one three-hour laboratory per week. The lectures are designed to cover material that directly supports the laboratories. Early in the course, laboratories explore the subsystems of an automated data acquisition system. The students then learn the operation of a PCMCIA (personal computer memory card international association) data acquisition card, write C/C++ programs to control the data acquisition, learn the operation of analog-to-digital and digital-to-analog converters, and learn the use of the C/C++ commands provided for controlling these subsystems. These concepts are introduced while doing typical experiments dealing with the measurement of temperature and strain and the evaluation of a temperature controller.
Keywords :
computer aided instruction; computer science education; data acquisition; educational courses; educational institutions; engineering education; C/C++ programs; Computer Aided Teaching Laboratory; Engineering Applications III; PCMCIA data acquisition card; Personal Computer Memory Card International Association; University of Denver; automated data acquisition; sophomore capstone course; Application software; Automatic control; Data acquisition; Education; Integrated circuit measurements; Knowledge engineering; Laboratories; Microcomputers; Strain measurement; Temperature measurement; 65; Automated data acquisition; capstone course; measurement; multidisciplinary;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/TE.2004.825539
Filename :
1356093
Link To Document :
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