Title :
Extremal and crest statistics of a negative resistance cube law element driven by random noise
Author :
Smits, T. ; Lambert, Russ
fDate :
9/1/1965 12:00:00 AM
Keywords :
Circuit noise; Electric resistance; Linearity; Power generation; Probability; Radio frequency; Radiofrequency integrated circuits; Statistics; Voltage;
Journal_Title :
Circuit Theory, IEEE Transactions on
DOI :
10.1109/TCT.1965.1082477
