Title :
A bibliography of accelerated test plans part II - references
Author :
Nelson, Wayne B.
Abstract :
This is the bibliography referenced in the article by Wayne B Nelson titled "A bibliography of accelerated test plans," published in the IEEE Transactions on Reliability June 2005 issue (vol.54, no.2, ISSN 0018-9529).
Keywords :
bibliographies; life testing; reliability; IEEE Transactions on Reliability; Wayne Nelson; accelerated test plan; bibliography; reliability; Acceleration; Bibliographies; Degradation; Electronic mail; Inspection; Life estimation; Life testing; Safety; Sampling methods; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2005.853289
