• DocumentCode
    1161008
  • Title

    A bibliography of accelerated test plans part II - references

  • Author

    Nelson, Wayne B.

  • Volume
    54
  • Issue
    3
  • fYear
    2005
  • Firstpage
    370
  • Lastpage
    373
  • Abstract
    This is the bibliography referenced in the article by Wayne B Nelson titled "A bibliography of accelerated test plans," published in the IEEE Transactions on Reliability June 2005 issue (vol.54, no.2, ISSN 0018-9529).
  • Keywords
    bibliographies; life testing; reliability; IEEE Transactions on Reliability; Wayne Nelson; accelerated test plan; bibliography; reliability; Acceleration; Bibliographies; Degradation; Electronic mail; Inspection; Life estimation; Life testing; Safety; Sampling methods; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2005.853289
  • Filename
    1505040
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1161008