Title :
Parameter estimation for a modified Weibull distribution, for progressively type-II censored samples
Author_Institution :
Dept. of Stat. Sci., Southern Methodist Univ., Dallas, TX, USA
Abstract :
In this paper, the estimation of parameters based on a progressively Type-II censored sample from a modified Weibull distribution is studied. The likelihood equations, and the maximum likelihood estimators are derived. The estimators based on a least-squares fit of a multiple linear regression on a Weibull probability paper plot are compared with the MLE via Monte Carlo simulations. The observed Fisher information matrix, as well as the asymptotic variance-covariance matrix of the MLE are derived. Approximate confidence intervals for the parameters are constructed based on the s-normal approximation to the asymptotic distribution of MLE, and log-transformed MLE. The coverage probabilities of the individual s-normal-approximation confidence intervals for the parameters are examined numerically. Some recommendations are made from the results of a Monte Carlo simulation study, and a numerical example is presented to illustrate all of the methods of inference developed here.
Keywords :
Monte Carlo methods; Weibull distribution; covariance matrices; least squares approximations; log normal distribution; maximum likelihood estimation; regression analysis; reliability theory; Fisher information matrix; Monte Carlo simulation; Type-II censored sample; Weibull probability plot; asymptotic variance-covariance matrix; inference method; interval estimation; least-square estimator; lifetime data; likelihood equation; log-transform; maximum likelihood estimator; modified Weibull distribution; multiple linear regression; parameter estimation; s-normal approximation; Density functional theory; Equations; Life estimation; Lifetime estimation; Linear regression; Maximum likelihood estimation; Parameter estimation; Probability density function; Testing; Weibull distribution; Interval estimation; Monte Carlo simulation; Weibull probability plot; lifetime data; maximum likelihood estimation;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.2005.853036