DocumentCode
1161052
Title
Fault tolerance of neural associative memories
Author
Nijhuis, J.A.G. ; Spaaenenburg, L.
Author_Institution
Inst. for Microelectron., Stuttgart, West Germany
Volume
136
Issue
5
fYear
1989
fDate
9/1/1989 12:00:00 AM
Firstpage
389
Lastpage
394
Abstract
The effects of hardware limitations and fabrication faults on the fault tolerance of neural associative memories using the Hopfield interconnect topology are investigated. It is shown that neural computing structures are not by definition fault tolerant, and that the degree of tolerance is very sensitive to the assumed physical fault model and to the nature of the stored information.
Keywords
content-addressable storage; fault tolerant computing; neural nets; Hopfield interconnect topology; fabrication faults; fault tolerance; hardware limitations; neural associative memories;
fLanguage
English
Journal_Title
Computers and Digital Techniques, IEE Proceedings E
Publisher
iet
ISSN
0143-7062
Type
jour
Filename
31390
Link To Document