Title :
Fault tolerance of neural associative memories
Author :
Nijhuis, J.A.G. ; Spaaenenburg, L.
Author_Institution :
Inst. for Microelectron., Stuttgart, West Germany
fDate :
9/1/1989 12:00:00 AM
Abstract :
The effects of hardware limitations and fabrication faults on the fault tolerance of neural associative memories using the Hopfield interconnect topology are investigated. It is shown that neural computing structures are not by definition fault tolerant, and that the degree of tolerance is very sensitive to the assumed physical fault model and to the nature of the stored information.
Keywords :
content-addressable storage; fault tolerant computing; neural nets; Hopfield interconnect topology; fabrication faults; fault tolerance; hardware limitations; neural associative memories;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
