Title :
SOCRATES: a highly efficient automatic test pattern generation system
Author :
Schulz, Michael H. ; Trischler, Erwin ; Sarfert, Thomas M.
Author_Institution :
Inst. of Comput. Aided Design, Tech. Univ. of Munich, West Germany
fDate :
1/1/1988 12:00:00 AM
Abstract :
An automatic test pattern generation system, SOCRATES, is presented. SOCRATES includes several novel concepts and techniques that significantly improve and accelerate the automatic test pattern generation process for combinational and scan-based circuits. Based on the FAN algorithm, improved implication, sensitization, and multiple backtrace procedures are described. The application of these techniques leads to a considerable reduction of the number of backtrackings and an earlier recognition of conflicts and redundancies. Several experiments using a set of combinational benchmark circuits demonstrate the efficiency of SOCRATES and its cost-effectiveness, even in a workstation environment
Keywords :
automatic testing; combinatorial circuits; logic testing; FAN algorithm; SOCRATES; automatic test pattern generation system; backtrackings; combinational benchmark circuits; conflicts; implication; multiple backtrace; redundancies; scan-based circuits; sensitization; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Costs; Design for testability; Test pattern generators; Very large scale integration; Workstations;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
