• DocumentCode
    1161169
  • Title

    New cumulative damage models for failure using stochastic processes as initial damage

  • Author

    Park, Chanseok ; Padgett, William J.

  • Volume
    54
  • Issue
    3
  • fYear
    2005
  • Firstpage
    530
  • Lastpage
    540
  • Abstract
    Based on a generalized cumulative damage approach with a stochastic process describing initial damage for a material specimen, a broad class of statistical models for material strength is developed. Plausible choices of stochastic processes for the initial damage include Brownian motion, geometric Brownian motion, and the gamma process; and additive & multiplicative cumulative damage functions are considered. The resulting general statistical model gives an accelerated test form of the inverse Gaussian distribution, special cases of which include some existing models in addition to several new models. Model parameterizations & estimation by maximum likelihood from accelerated test data are discussed, and the applicability of the general model is illustrated for three sets of strength data. The proposed models are compared with the power-law Weibull model, and the inverse Gaussian generalized linear models.
  • Keywords
    Brownian motion; Gaussian distribution; Weibull distribution; life testing; materials testing; maximum likelihood estimation; reliability theory; stochastic processes; Weibull model; accelerated testing; cumulative damage models; gamma process; geometric Brownian motion; inverse Gaussian distribution; material strength; maximum likelihood; parameterization; statistical model; stochastic processes; Additives; Gaussian distribution; Inverse problems; Life estimation; Maximum likelihood estimation; Parameter estimation; Probability distribution; Stochastic processes; Tensile stress; Testing; Accelerated testing; Brownian motion; cumulative damage; gamma process; inverse Gaussian distribution; strength distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2005.853278
  • Filename
    1505058