Title :
Optical study on II-VI semiconductor nanoparticles in Langmuir-Blodgett films
Author :
Nabok, Alexei ; Ray, Asim K. ; Iwantono ; Hassan, Aseel ; Simmonds, Mike
Author_Institution :
Sch. of Eng., Sheffield Hallam Univ., UK
fDate :
3/1/2003 12:00:00 AM
Abstract :
Cadmium sulfide (CdS) nanoparticles formed within Langmuir-Blodgett (LB) films of stearic acid and calix[8]arene were studied with different optical methods including surface plasmon resonance (SPR), ellipsometry and UV-visible absorption and fluorescence spectroscopies. For the first time, the process of formation of CdS nanoparticles within LB films was monitored in-situ with SPR. The results of ellipsometry, SPR and UV-vis absorption spectroscopy were analyzed to evaluate simultaneously the thickness, refractive index and extinction coefficient of LB films. It was shown that all three parameters increase as a result of formation of CdS nanoparticles. Photoluminescence measurements provided direct confirmation directly for previous observation with UV-vis absorption spectroscopy of the blue spectral shift caused by CdS particles formation. The observed large Stoke\´s shift of the luminescence band is discussed in terms of the formation of "dark excitons" in the platelet-type CdS nanoclusters. AFM study shows the formation of pseudo-two dimensional platelets of CdS with the lateral dimensions in the range of 20-30 nm.
Keywords :
II-VI semiconductors; Langmuir-Blodgett films; atomic force microscopy; cadmium compounds; ellipsometry; excitons; extinction coefficients; fluorescence; nanoparticles; refractive index; surface plasmon resonance; ultraviolet spectra; visible spectra; CdS; II-VI semiconductor nanoparticles; Langmuir-Blodgett film; Stokes shift; UV-visible absorption spectroscopy; atomic force microscopy; blue shift; calix[8]arene; dark exciton; ellipsometry; extinction coefficient; fluorescence spectroscopy; optical properties; pseudo-two-dimensional platelet; quantum confinement; refractive index; stearic acid; surface plasmon resonance; Absorption; Cadmium compounds; Ellipsometry; Nanoparticles; Optical films; Optical refraction; Optical variables control; Plasmons; Semiconductor films; Spectroscopy;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2003.808514