DocumentCode :
1161428
Title :
Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards
Author :
Engelmaier, Werner ; Attarwala, Abbas I.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
Volume :
12
Issue :
2
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
284
Lastpage :
296
Abstract :
The reliability of the attachment of 100 I/O ceramic chip carriers (CCs) surface mounted to FR-4 epoxy/glass circuit boards using clip-leads has been investigated. Clip-leads, commercially available from two vendors, of significantly different designs were utilized. The accelerated tests involved the accurate reproduction of the thermal and physical conditions-internal cyclic power dissipation, external thermal cycling of forced air stream, thermal gradients, mounting hardware, etc.-encountered by the product in use. The test acceleration (by acceleration factors between 12 and 20 for mean time to failure) was accomplished with shorter dwell times at the temperature extremes, resulting in 96 accelerated fatigue cycles per day. The distinct difference in lead compliancy between the two clip-lead designs is clearly reflected in the results of the accelerated reliability tests. The Type-A `J-lead design´ clip-lead (K=58 lb/in) CCs showed a median life to failure of 12000 cycles, while the Type-B `hinged S-bend design´ clip-lead (K=7.5 lb/in) CCs exhibited no failures when the test was terminated at 100000 cycles. Failure mode analysis shows that all Type-A clip-lead solder joints have failed after 48000 accelerated cycles due to the CC/substrate expansion mismatch: at 100000 accelerated cycles a significant number of clip joints showed cracks due to the solder/ceramic CC material expansion differential
Keywords :
environmental testing; failure analysis; life testing; printed circuit manufacture; reliability; surface mount technology; FR-4 circuit boards; J-lead design; SMT; accelerated fatigue cycles; accelerated reliability tests; accelerated tests; clip-lead designs; clip-leaded ceramic chip carriers; different designs; epoxy/glass circuit boards; expansion mismatch; external thermal cycling; failure analysis; forced air stream; hinged S-bend lead design; internal cyclic power dissipation; lead compliancy; mean time to failure; mounting hardware; surface mount attachment; thermal gradients; Acceleration; Carbon capture and storage; Ceramics; Circuit testing; Glass; Hardware; Life estimation; Power dissipation; Printed circuits; Thermal force;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.31435
Filename :
31435
Link To Document :
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