• DocumentCode
    1161476
  • Title

    Simultaneous parameter estimation and segmentation of Gibbs random fields using simulated annealing

  • Author

    Lakshmanan, Sridhar ; Derin, Haluk

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • Volume
    11
  • Issue
    8
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    799
  • Lastpage
    813
  • Abstract
    An adaptive segmentation algorithm is developed which simultaneously estimates the parameters of the underlying Gibbs random field (GRF)and segments the noisy image corrupted by additive independent Gaussian noise. The algorithm, which aims at obtaining the maximum a posteriori (MAP) segmentation is a simulated annealing algorithm that is interrupted at regular intervals for estimating the GRF parameters. Maximum-likelihood (ML) estimates of the parameters based on the current segmentation are used to obtain the next segmentation. It is proven that the parameter estimates and the segmentations converge in distribution to the ML estimate of the parameters and the MAP segmentation with those parameter estimates, respectively. Due to computational difficulties, however, only an approximate version of the algorithm is implemented. The approximate algorithm is applied on several two- and four-region images with different noise levels and with first-order and second-order neighborhoods
  • Keywords
    optimisation; parameter estimation; pattern recognition; picture processing; probability; Gaussian noise; Gibbs random fields; adaptive segmentation; maximum likelihood estimates; optimisation; parameter estimation; pattern recognition; picture processing; simulated annealing; Computational modeling; Gaussian noise; Helium; Image segmentation; Markov random fields; Maximum likelihood estimation; Noise level; Parameter estimation; Partitioning algorithms; Simulated annealing;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.31443
  • Filename
    31443