DocumentCode
1161493
Title
A probabilistic model for the fault tolerance of multilayer perceptrons
Author
Merchawi, N.S. ; Kumara, Soundar R T ; Das, Chita R.
Author_Institution
Dept. of Ind. & Manuf. Syst. Eng., Windsor Univ., Ont., Canada
Volume
7
Issue
1
fYear
1996
fDate
1/1/1996 12:00:00 AM
Firstpage
201
Lastpage
205
Abstract
This paper presents a theoretical approach to determine the probability of misclassification of the multilayer perceptron (MLP) neural model, subject to weight errors. The type of applications considered are classification/recognition tasks involving binary input-output mappings. The analytical models are validated via simulation of a small illustrative example. The theoretical results, in agreement with simulation results, show that, for the example considered, Gaussian weight errors of standard deviation up to 22% of the weight value can be tolerated. The theoretical method developed here adds predictability to the fault tolerance capability of neural nets and shows that this capability is heavily dependent on the problem data
Keywords
error statistics; fault tolerant computing; multilayer perceptrons; pattern classification; performance evaluation; probability; Gaussian weight errors; binary input-output mappings; fault tolerance; misclassification; multilayer perceptrons; probabilistic model; probability; Analytical models; Computer networks; Fault tolerance; Manufacturing industries; Modeling; Multilayer perceptrons; Neural networks; Neurons; Redundancy; Systems engineering and theory;
fLanguage
English
Journal_Title
Neural Networks, IEEE Transactions on
Publisher
ieee
ISSN
1045-9227
Type
jour
DOI
10.1109/72.478405
Filename
478405
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