• DocumentCode
    1161493
  • Title

    A probabilistic model for the fault tolerance of multilayer perceptrons

  • Author

    Merchawi, N.S. ; Kumara, Soundar R T ; Das, Chita R.

  • Author_Institution
    Dept. of Ind. & Manuf. Syst. Eng., Windsor Univ., Ont., Canada
  • Volume
    7
  • Issue
    1
  • fYear
    1996
  • fDate
    1/1/1996 12:00:00 AM
  • Firstpage
    201
  • Lastpage
    205
  • Abstract
    This paper presents a theoretical approach to determine the probability of misclassification of the multilayer perceptron (MLP) neural model, subject to weight errors. The type of applications considered are classification/recognition tasks involving binary input-output mappings. The analytical models are validated via simulation of a small illustrative example. The theoretical results, in agreement with simulation results, show that, for the example considered, Gaussian weight errors of standard deviation up to 22% of the weight value can be tolerated. The theoretical method developed here adds predictability to the fault tolerance capability of neural nets and shows that this capability is heavily dependent on the problem data
  • Keywords
    error statistics; fault tolerant computing; multilayer perceptrons; pattern classification; performance evaluation; probability; Gaussian weight errors; binary input-output mappings; fault tolerance; misclassification; multilayer perceptrons; probabilistic model; probability; Analytical models; Computer networks; Fault tolerance; Manufacturing industries; Modeling; Multilayer perceptrons; Neural networks; Neurons; Redundancy; Systems engineering and theory;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/72.478405
  • Filename
    478405