DocumentCode :
116170
Title :
Pattern recognition in mental processes: Determining vestiges of the subconscious through ultrametric component analysis
Author :
Murtagh, Fionn
Author_Institution :
Sch. of Comput. Sci. & Inf., De Montfort Univ., Leicester, UK
fYear :
2014
fDate :
18-20 Aug. 2014
Firstpage :
155
Lastpage :
161
Abstract :
We develop a novel consensus of hierarchical clusterings. We do this in order to have a framework (including visualization and supporting interpretation) for the parts of the data that are determined to be ultrametric. Furthermore a major objective is to determine locally ultrametric relationships as opposed to non-local ultrametric relationships. This work aims at a major new application, namely quantifying and interpreting vestiges of the subconscious, or what could be arising from subconscious processes, in narrative, through finding emotional content, metaphor and other potential expressions of the subconscious, i.e. of symmetric logic as defined by the psychoanalyst, Matte Blanco.
Keywords :
data visualisation; pattern clustering; psychology; emotional content; hierarchical clusterings; mental processes; metaphor; pattern recognition; symmetric logic; ultrametric component analysis; ultrametric relationships; visualization; Educational institutions; Extraterrestrial measurements; Image color analysis; Joining processes; Marine vehicles; Semantics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Cognitive Informatics & Cognitive Computing (ICCI*CC), 2014 IEEE 13th International Conference on
Conference_Location :
London
Print_ISBN :
978-1-4799-6080-4
Type :
conf
DOI :
10.1109/ICCI-CC.2014.6921455
Filename :
6921455
Link To Document :
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