Title :
An algorithmic approach to fault diagnosis in linear systems
Author :
Kim, Jee Hong ; Bien, Zeungnam
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
fDate :
8/1/1989 12:00:00 AM
Abstract :
An algorithmic approach for multiple fault diagnosis of linear discrete-time systems is proposed. Based on notions of an expected deviation vector and variation factors, it is shown that t faults in functional units of a dynamic system can be diagnosed with t+1 sample times. The method is considered efficient when the number of faults is unknown but small and when the sampling period is lengthy, as in chemical process with large time constants. Its effectiveness is illustrated by simulated examples
Keywords :
discrete time systems; fault location; linear systems; chemical process; dynamic system; fault diagnosis; linear discrete-time systems; linear systems; Chemical processes; Dictionaries; Fault detection; Fault diagnosis; Linear systems; Parameter estimation; Production systems; Redundancy; Sampling methods; Vectors;
Journal_Title :
Industrial Electronics, IEEE Transactions on