Title :
Investigation of all-optical error detection circuit using SOA-MZI-based XOR gates at 10 Gbit/s
Author :
Suzuki, M. ; Uenohara, Hiroyuki
Author_Institution :
Microsyst. Res. Center, Precision & Intell. Lab., Tokyo Inst. of Technol., Yokohama
Abstract :
The operation of an all-optical error detection circuit consisting of an all-optical exclusive OR (XOR) gate for an encoder and two-stage all-optical XOR gates for a decoder using SOA-MZIs has been investigated. 10 and 40 Gbit/s operation of all-optical XOR gates were obtained. Error signals in the syndrome at 10 Gbit/s based on the all-optical XOR gates were achieved for the first time.
Keywords :
Mach-Zehnder interferometers; error detection; optical logic; semiconductor optical amplifiers; Mach-Zehnder interferometers; all-optical XOR gates; all-optical error detection circuit; bit rate 10 Gbit/s; semiconductor optical amplifiers;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20093461
