DocumentCode :
1162038
Title :
Test-pattern-reduced decoding for turbo product codes with multi-error-correcting eBCH codes
Author :
Chen, Guo Tai ; Cao, Lei ; Yu, Lun ; Chen, Chang Wen
Author_Institution :
Fuzhou Univ., Fuzhou
Volume :
57
Issue :
2
fYear :
2009
fDate :
2/1/2009 12:00:00 AM
Firstpage :
307
Lastpage :
310
Abstract :
We present a method to reduce the number of test patterns (TPs) decoded in the Chase-II algorithm for turbo product codes (TPCs) constructed with multi-error-correcting extended Bose-Chaudhuri-Hocquengem (eBCH) codes. We classify TPs into different conditions based on the relationship between syndromes and the number of errors so that TPs with the same codeword are not decoded except the one with the least number of errors. For eBCH with code length of 64, simulation results show that over 50% of TPs need not to be decoded without any performance degradation.
Keywords :
BCH codes; decoding; error correction codes; turbo codes; extended Bose-Chaudhuri-Hocquengem codes; multierror-correcting eBCH codes; test-pattern-reduced decoding; turbo product codes; Communications Society; Convolutional codes; Decoding; Degradation; Error correction codes; Physics; Product codes; Redundancy; Testing; Turbo codes; Chase-II algorithm, extended BCH codes, test patterns, turbo product codes.;
fLanguage :
English
Journal_Title :
Communications, IEEE Transactions on
Publisher :
ieee
ISSN :
0090-6778
Type :
jour
DOI :
10.1109/TCOMM.2009.02.0603752
Filename :
4784334
Link To Document :
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