DocumentCode :
1162041
Title :
Numerical modeling of nonplanar oxidation coupled with stress effects
Author :
Umimoto, Hiroyuki ; Odanaka, Shinji ; Nakao, Ichiro ; Esaki, Hideya
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Volume :
8
Issue :
6
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
599
Lastpage :
607
Abstract :
The study focuses on the numerical solution method based on a finite-difference approach with the coordinate transformation method for simulating the nonplanar oxide growth. A relaxation technique is introduced to incorporate the stress effect into oxidation kinetic equations maintaining numerical stability. In addition, for simulating the stress-dependent oxide growth, the role of the boundary condition at the free-oxide surface is discussed. The present method allows an accurate evaluation of the local stress distribution in nonplanar oxide structures and realizes the precise simulation of oxide shapes under the large stress effect. They are demonstrated in applications to both the LOCOS process with thick nitride film and the trench oxidation process, which strongly depends on the oxidation-induced stress at trench corners
Keywords :
difference equations; integrated circuit technology; oxidation; relaxation theory; semiconductor device models; stress effects; LOCOS process; boundary condition; coordinate transformation method; finite-difference approach; free-oxide surface; local stress distribution; modeling; monolithic IC; nonplanar oxidation; nonplanar oxide structures; numerical solution method; numerical stability; oxidation kinetic equations; relaxation technique; semiconductor devices; simulation; stress effects; stress-dependent oxide growth; thick nitride film; trench oxidation process; Boundary conditions; Deformable models; Equations; Finite difference methods; Kinetic theory; Numerical models; Oxidation; Predictive models; Shape; Stress;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.31516
Filename :
31516
Link To Document :
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