DocumentCode :
1162161
Title :
Long-term reliability of single-mode fibers when exposed to high-power laser light
Author :
Fukai, Chisato ; Kurokawa, Kenji ; Tajima, Katsusuke ; Nakajima, Kazuhide ; Sankawa, Izumi ; Shinohara, Hiromichi
Author_Institution :
NTT Access Network Service Syst. Labs., Ibaraki, Japan
Volume :
23
Issue :
9
fYear :
2005
Firstpage :
2713
Lastpage :
2718
Abstract :
The reliability of a pure silica-core single-mode fiber (SCF) and a germanium-doped fiber [dispersion-shifted fiber (DSF)] with long-term exposure to continuous-wave (CW) high-power laser light is reported. It was found that the optical loss in the 0.6-1.6-μm region and the Raman spectra of SCF and DSF remained unchanged after 1900 h of exposure to an 8-W CW laser light and 2000 h of exposure to an 8.5-W CW laser light at 1.48-μm, respectively. The nonbridging oxygen hole center (NBOHC) concentration generated in SCF by 1900 h of exposure is estimated to be below the detection limit of 2×1012 cm-3. SCF and DSF can be expected to exhibit long-term (> 20 years) reliability when exposed to several watts of laser power in the S, C, and L bands in terms of optical degradation due to defect formation via multiphoton absorption.
Keywords :
Raman spectra; elemental semiconductors; germanium; laser beam effects; multiphoton processes; optical fibre dispersion; optical fibre losses; optical fibre networks; optical fibre testing; reliability; silicon compounds; 0.6 to 1.6 mum; 1900 h; 2000 h; 8 W; 8.5 W; Raman spectra; defect formation; germanium-doped dispersion-shifted fiber; high-power laser light exposure; multiphoton absorption; nonbridging oxygen hole center; optical degradation; optical loss; silica core; single mode fiber reliability; Fiber lasers; Nonlinear optics; Optical attenuators; Optical fiber testing; Optical fibers; Optical harmonic generation; Optical refraction; Optical scattering; Stimulated emission; Telecommunication network reliability; Optical fiber losses; Raman scattering; optical fibers; reliability testing;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2005.853136
Filename :
1506849
Link To Document :
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