• DocumentCode
    1162161
  • Title

    Long-term reliability of single-mode fibers when exposed to high-power laser light

  • Author

    Fukai, Chisato ; Kurokawa, Kenji ; Tajima, Katsusuke ; Nakajima, Kazuhide ; Sankawa, Izumi ; Shinohara, Hiromichi

  • Author_Institution
    NTT Access Network Service Syst. Labs., Ibaraki, Japan
  • Volume
    23
  • Issue
    9
  • fYear
    2005
  • Firstpage
    2713
  • Lastpage
    2718
  • Abstract
    The reliability of a pure silica-core single-mode fiber (SCF) and a germanium-doped fiber [dispersion-shifted fiber (DSF)] with long-term exposure to continuous-wave (CW) high-power laser light is reported. It was found that the optical loss in the 0.6-1.6-μm region and the Raman spectra of SCF and DSF remained unchanged after 1900 h of exposure to an 8-W CW laser light and 2000 h of exposure to an 8.5-W CW laser light at 1.48-μm, respectively. The nonbridging oxygen hole center (NBOHC) concentration generated in SCF by 1900 h of exposure is estimated to be below the detection limit of 2×1012 cm-3. SCF and DSF can be expected to exhibit long-term (> 20 years) reliability when exposed to several watts of laser power in the S, C, and L bands in terms of optical degradation due to defect formation via multiphoton absorption.
  • Keywords
    Raman spectra; elemental semiconductors; germanium; laser beam effects; multiphoton processes; optical fibre dispersion; optical fibre losses; optical fibre networks; optical fibre testing; reliability; silicon compounds; 0.6 to 1.6 mum; 1900 h; 2000 h; 8 W; 8.5 W; Raman spectra; defect formation; germanium-doped dispersion-shifted fiber; high-power laser light exposure; multiphoton absorption; nonbridging oxygen hole center; optical degradation; optical loss; silica core; single mode fiber reliability; Fiber lasers; Nonlinear optics; Optical attenuators; Optical fiber testing; Optical fibers; Optical harmonic generation; Optical refraction; Optical scattering; Stimulated emission; Telecommunication network reliability; Optical fiber losses; Raman scattering; optical fibers; reliability testing;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.853136
  • Filename
    1506849