Title :
Computing bit-error probabilities for avalanche photodiode receivers by large deviations theory
Author :
Letaief, Khaled ; Sadowsky, J.S.
Author_Institution :
Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
fDate :
5/1/1992 12:00:00 AM
Abstract :
A bit error probability analysis of direct detection optical receivers is presented employing avalanche photodiodes. An asymptotic analysis for large signal intensities is presented. This analysis provides some useful insight into the balance between the Poisson statistics, the avalanche gain statistics, and the Gaussian thermal noise. The conjugate distribution is developed. It is obtained by applying the large-deviation exponential twisting formula. It is demonstrated that this conjugate distribution can be used to obtain numerically efficient Monte Carlo estimates of the bit-error probability via the importance sampling method
Keywords :
Monte Carlo methods; avalanche photodiodes; error statistics; optical communication equipment; receivers; Gaussian thermal noise; Monte Carlo estimates; Poisson statistics; asymptotic analysis; avalanche gain statistics; avalanche photodiode receivers; bit error probability analysis; conjugate distribution; direct detection optical receivers; exponential twisting formula; importance sampling method; large deviations theory; large signal intensities; optical communication; Avalanche photodiodes; Error analysis; Error probability; Gaussian noise; Monte Carlo methods; Optical detectors; Optical receivers; Signal analysis; Statistical analysis; Statistical distributions;
Journal_Title :
Information Theory, IEEE Transactions on