Title :
Optimum degeneration for minimum mismatch in bipolar current sources
Author :
Vadipour, Morteza
Author_Institution :
ZAG Chemie Co., Tehran, Iran
fDate :
10/1/1994 12:00:00 AM
Abstract :
Statistical analysis of mismatch in bipolar degenerated current sources reveals the existence of an optimum degeneration for minimum mismatch. Extra degeneration does not improve matching but degrades it and forces unnecessary DC restrictions on the circuit
Keywords :
bipolar integrated circuits; constant current sources; equivalent circuits; linear integrated circuits; statistical analysis; bipolar current sources; degenerated current sources; linear bipolar IC; minimum mismatch; optimum degeneration; statistical analysis; Artificial intelligence; Degradation; Geometry; Impedance matching; Mirrors; Nonlinear circuits; Random variables; Statistical analysis;
Journal_Title :
Solid-State Circuits, IEEE Journal of
