Combined TLP/RF testing system for detection of ESD failures in RF circuits

We present a modified transmission-line pulse (TLP) measurement system in which radio frequency (RF) functionality tests, along with the conventional leakage current measurement, are performed after each pulse to detect failure. Measurement results from 5-GHz low-noise amplifiers (LNAs) show that RF metrics degrade before the leakage current increases. Also, we introduce an electrostatic discharge (ESD)-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.