Title :
CO2 laser processing of alumina (Al2O3) printed circuit board substrates
Author :
Moorhouse, Colin J. ; Villarreal, Francisco ; Wendland, Jozef J. ; Baker, Howard J. ; Hall, Denis R. ; Hand, Duncan P.
Author_Institution :
Sch. of Eng. & Phys. Sci., Heriot-Watt Univ., Edinburgh, UK
fDate :
7/1/2005 12:00:00 AM
Abstract :
We report the results of an investigation of the laser-material interaction processes involved in laser drilling of alumina, through the use of an enhanced peak power (2.5 kW) CO2 laser and novel temporal pulse formats. Peak power was varied from 30 W to 2 kW for pulses of constant energy to observe the effect produced on scribe depth. High-speed videography of hole formation has been combined with microscopic analysis to investigate the key processes involved in laser processing of alumina. Plasma screening was observed for short, high peak power laser pulses, and optimal scribing was achieved in the weakly plasma absorbing regime. A new processing technique for scribing alumina has been developed, which exploits the fast response of the laser to produce novel temporal pulse shapes, which can be modified to generate cleaner holes. Scribe speeds of up to 280 mm·s-1 were obtained for scribe holes >200 μm deep and 150 μm apart, with no material plugging the hole, in 0.635-mm-thick 96% alumina.
Keywords :
alumina; carbon compounds; high-speed optical techniques; laser beam machining; laser materials processing; printed circuit manufacture; 0.635 mm; 2.5 kW; Al2O3; CO2; alumina laser drilling; alumina laser processing; alumina printed circuit board substrates; alumina scribing; high-speed videography; hole formation; laser-material interaction processes; melt ejection; microscopic analysis; plasma screening; power laser pulses; temporal pulse formats; temporal pulse shapes; Drilling; Microscopy; Optical materials; Optical pulse generation; Optical pulse shaping; Optical pulses; Plasma displays; Plasma materials processing; Power lasers; Shape; Alumina laser processing; enhanced peak power; high-speed videography; melt ejection; plasma screening;
Journal_Title :
Electronics Packaging Manufacturing, IEEE Transactions on
DOI :
10.1109/TEPM.2005.852232