DocumentCode
1162534
Title
Analyses and design of bias circuits tolerating output voltages above BVCEO
Author
Veenstra, Hugo ; Hurkx, G.A.M. ; van Goor, Dave ; Brekelmans, Hans ; Long, John R.
Author_Institution
Philips Res. Labs., Eindhoven, Netherlands
Volume
40
Issue
10
fYear
2005
Firstpage
2008
Lastpage
2018
Abstract
Due to the inevitable tradeoff between speed and breakdown voltage, the spectacular speed improvement of modern SiGe processes in recent history has partially been achieved at the cost of a reduction in breakdown voltages. Because supply voltages have hardly been reduced however, circuits operating at a supply voltage above the collector-emitter breakdown voltage (BVCEO) are common practice today and collector-base avalanche currents are therefore of major concern. Transistors that need to handle a collector-emitter voltage above (BVCEO) are typically found as output transistors in output driver stages and in bias current circuits. Such circuits can be designed to tolerate collector-emitter voltages above (BVCEO) by driving the base terminal with a relatively low impedance. This paper analyzes various conventional as well as two new bias current circuits supporting operation at collector voltages above (BVCEO). In the new circuits, feedforward and feedback avalanche current compensation techniques are introduced that obtain a substantial increase in output breakdown voltage of the bias circuits and improve the accuracy of the current mirror at output voltages above (BVCEO). With the feedback technique, a measured increase in output breakdown voltage by more than 2 V is demonstrated while the accuracy of the current mirror ratio at output voltages of 2 to 3 times (BVCEO) is improved by an order of magnitude.
Keywords
avalanche breakdown; bipolar transistor circuits; current mirrors; network analysis; network topology; avalanche currents; bias circuits tolerating output voltages design; collector-emitter breakdown voltage; current compensation techniques; current mirror; Breakdown voltage; Costs; Driver circuits; Feedback circuits; Germanium silicon alloys; History; Impedance; Mirrors; Output feedback; Silicon germanium; Avalanche breakdown; bias current source; current mirror;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2005.852829
Filename
1506888
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