Title :
Guest editors´ introduction: board test
Author :
Lobetti-Bodoni, M. ; Ben Bennetts, R.G.
Author_Institution :
Siemens Mobile Communications
Abstract :
Presents the guest editorial for this issue of the publication.
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Engines; Inspection; Measurement standards; Mobile communication; Optical crosstalk; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1188256
