Title :
Embedded boundary scan
Author :
Van Treuren, Bradford G. ; Miranda, Jose M.
Author_Institution :
Test Solutions Group, Lucent Technol., Holmdel, NJ, USA
Abstract :
As boundary scan technology continues to mature, engineers continue to find innovative ways of using the IEEE Std. 1149.1 facilities throughout the life cycle of a board. Lucent Technologies is at the forefront of this development, and the authors here describe how they have expanded the use and reuse of the IEEE 1149.1 board tests into a variety of additional test environments.
Keywords :
boundary scan testing; logic testing; IEEE 1149.1 board tests; boundary scan technology; boundary scan tests; hardware modules; life cycle; test environments; Application specific processors; Automatic testing; Control systems; Embedded software; Joining processes; LAN interconnection; Pins; Software standards; Software testing; System testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1188258
