Title :
Electromagnetic signatures as a tool for connectionless test
Author :
Salamati, Mahnaz ; Stranneby, Dag
Author_Institution :
Electron. Production Eng. Res. Group, Orebro Univ., Sweden
Abstract :
When we test boards, we usually think in terms of traditional electrical test (in-circuit, flying probe) and nonelectrical test (optical, x-ray). This Orebro University article develops an alternative, connectionless technique based on scanning the electromagnetic field generated by active on-board devices. Could this make it into industry as an additional diagnostic tool?.
Keywords :
circuit testing; logic testing; Orebro University; UUT; analog circuitry; built-in self-test; connectionless technique; connectionless test; diagnostic tool; electromagnetic field measurements; functional testing; spectral analysis; troubleshoot; unit under test; Current measurement; Electromagnetic fields; Electromagnetic measurements; Feature extraction; Frequency; Performance evaluation; Probes; Signal processing; Spatial databases; Testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1188259
