Title :
CMOS readout circuit allowing microbolometer arrays to operate without temperature stabilisation
Author :
Kang, S.G. ; Lee, Y.S. ; Lee, H.C.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., KAIST, Daejeon, South Korea
Abstract :
A new CMOS readout circuit that controls the non-uniformity of microbolometer arrays as a function of operating temperature change is described. This circuit provides a nonlinear bias current for operating temperature using a MOS transistor that is operated in the subthreshold region. This approach allows microbolometer arrays to operate without temperature stabilisation up to an operating temperature change of approximately 40K.
Keywords :
CMOS integrated circuits; MOSFET; bolometers; infrared detectors; readout electronics; 40 K; CMOS readout circuit; MOS transistor; microbolometer arrays; nonlinear bias current; nonuniformity calibration method; operating temperature change; temperature stabilisation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20046830
