• DocumentCode
    1163794
  • Title

    Model Parameterization of Nonlinear Devices Using Impedance Spectroscopy

  • Author

    Kowal, Julia ; Hente, Dirk ; Sauer, Dirk Uwe

  • Author_Institution
    Electrochem. Energy Conversion & Storage Syst. Group, RWTH Aachen Univ., Aachen
  • Volume
    58
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    2343
  • Lastpage
    2350
  • Abstract
    In this paper, a new approach is used to identify the parameters of a large-signal lumped-element model for nonlinear devices based on small-signal impedance measurements at several operating points. Starting from the large-signal impedance of an equivalent circuit with nonlinear devices, the relationship between current and voltage is derived by the determining nonlinear system equation. This differential equation for a first-order model is then linearized via nonlinear series expansion using the perturbation approach. The linearized ac part (which is the fundamental frequency part) is then transformed into the frequency domain to find a representation of the complex small-signal impedance for a given operating point. Large-signal modeling based on small-signal measurements is successfully demonstrated for organic light-emitting diodes.
  • Keywords
    differential equations; electric impedance measurement; equivalent circuits; lumped parameter networks; nonlinear systems; organic light emitting diodes; differential equation; equivalent circuit; impedance spectroscopy; large-signal lumped-element model; model parameterization; nonlinear devices; nonlinear system equation; organic light-emitting diodes; perturbation approach; small-signal impedance measurements; Circuit modeling; curve fitting; equivalent circuits; impedance measurement; large-signal behavior; nonlinearities; organic light-emitting diode (OLED); perturbation approach;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2013927
  • Filename
    4785146