• DocumentCode
    1163824
  • Title

    Measurement of slowly varying component in phase error distribution of a large-channel-spacing arrayed-waveguide grating

  • Author

    Takada, K. ; Satoh, S.

  • Author_Institution
    Dept. of Electron. Eng., Gunma Univ., Kiryu, Japan
  • Volume
    40
  • Issue
    23
  • fYear
    2004
  • Firstpage
    1486
  • Lastpage
    1487
  • Abstract
    It has been difficult to measure the phase error distribution of a large-channel-spacing arrayed-waveguide grating (AWG) with optical low coherence interferometry (OLCI). In this reported work OLCI was successfully used to measure the slowly varying component in the distribution of a 1 THz-spaced AWG that was the primary filter in an ultra-high-density multi/demultiplexer. The spectral sidelobe of the AWG can be reduced by using the component to achieve the lowest possible accumulated crosstalk in the multi/demultiplexer.
  • Keywords
    arrayed waveguide gratings; channel spacing; demultiplexing equipment; light interferometry; multiplexing equipment; optical crosstalk; submillimetre wave devices; waveguide filters; 1 THz; accumulated crosstalk; arrayed waveguide gratings; large channel spacing; low coherence interferometry; optical interferometry; phase error distribution; slowly varying waveguide component; spectral sidelobe; ultra high density demultiplexer; ultra high density multiplexer;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20046654
  • Filename
    1358951