Title :
The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future
Author :
Ramdani, Mohamed ; Sicard, Etienne ; Boyer, Alexandre ; Ben Dhia, S. ; Whalen, James J. ; Hubing, Todd H. ; Coenen, Mart ; Wada, Osami
Author_Institution :
Ecole Super. d´´Electron. de lOuest (ESEO), Angers
Abstract :
Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today´s billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.
Keywords :
electromagnetic compatibility; monolithic integrated circuits; system-on-chip; IC technology; billon-transistor system-on-chip; discrete devices; electromagnetic compatibility; integrated circuits; semiconductor technology; DH-HEMTs; Electromagnetic compatibility; Electromagnetic devices; Electromagnetic measurements; History; IEC standards; Integrated circuit modeling; Radiofrequency interference; SPICE; System-on-a-chip; Emission; ICs; history; modeling; roadmap; standards; susceptibility;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2008.2008907