DocumentCode
1164263
Title
Analysis of gain dynamics of erbium-doped fiber amplifiers for wavelength-division-multiplexing networks
Author
Ono, Hirotaka ; Shimizu, Makoto
Author_Institution
NTT Photonics Labs., NTT Corp., Kanagawa, Japan
Volume
39
Issue
4
fYear
2003
fDate
4/1/2003 12:00:00 AM
Firstpage
541
Lastpage
547
Abstract
The gain dynamics in erbium-doped fibers (EDFs) with various numerical apertures (NAs) and cutoff wavelengths used in amplifiers employed in wavelength-division-multiplexing (WDM) networks is investigated by using the time-dependent amplifier model. The calculation shows that the transient response at a time immediately after some channels have been dropped depends on the cutoff wavelength, and the cutoff wavelength for the highest transient response is independent of NA. The calculation also shows that the transient response for a constant cutoff wavelength increases with an increase in NA. Experimental results for the transient response of EDFs with similar NAs and different cutoff wavelengths agree with the calculated results for various input signal powers, input signal power changes, and surviving channel wavelengths when there is no influence of neglection of amplified spontaneous emission and EDF background loss on the calculation.
Keywords
erbium; optical communication equipment; optical fibre amplifiers; optical fibre networks; transient response; wavelength division multiplexing; amplified spontaneous emission; background loss; cutoff wavelength; cutoff wavelengths; erbium-doped fiber amplifiers; gain dynamics; input signal power changes; input signal powers; numerical apertures; surviving channel wavelengths; time-dependent amplifier model; transient response; wavelength-division-multiplexing networks; Erbium-doped fiber amplifier; Fiber nonlinear optics; Nonlinear optics; Optical fiber amplifiers; Optical fiber networks; Optical pumping; Optical receivers; Optical saturation; Stimulated emission; Transient response;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2003.809332
Filename
1188755
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