DocumentCode :
1164343
Title :
Impulse Voltage Field Emission Characteristics and Breakdown Dependency Upon Field Strength in Vacuum Gaps
Author :
Shioiri, T. ; Ohshima, I. ; Honda, M. ; Okumura, H. ; Takahashi, H. ; Yoshida, H.
Author_Institution :
Toshiba Corporation
Issue :
10
fYear :
1982
Firstpage :
4178
Lastpage :
4184
Abstract :
High voltage impulses were used to investigate various possible factors influencing the prebreakdown current and breakdown in vacuum gaps of sphere-to- sphere and rod-to-plane.
Keywords :
Anodes; Breakdown voltage; Cathodes; Dielectric breakdown; Electrodes; Heating; Impulse testing; Insulation; Interrupters; Vacuum breakdown;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1982.317097
Filename :
4111236
Link To Document :
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