DocumentCode
1164425
Title
IOC-LP: hybrid test data compression/ decompression scheme for low power testing
Author
Chun, Se Young ; Kim, Youngjae ; Yang, Ming-Hsuan ; Kang, Sook-Yang
Volume
153
Issue
4
fYear
2006
fDate
8/1/2006 12:00:00 AM
Firstpage
391
Lastpage
398
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings
Publisher
iet
ISSN
1350-2409
Type
jour
Filename
1681683
Link To Document