• DocumentCode
    1164666
  • Title

    Fast identification n-widths and uncertainty principles for LTI and slowly varying systems

  • Author

    Zames, George ; Lin, Lin ; Le Yi Wang

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    39
  • Issue
    9
  • fYear
    1994
  • fDate
    9/1/1994 12:00:00 AM
  • Firstpage
    1827
  • Lastpage
    1838
  • Abstract
    The optimal worst-case uncertainty that can be achieved by identification depends on the observation time. In the first part of the paper, this dependence is evaluated for selected linear time invariant systems in the l1 and H norms and shown to be derivable from a monotonicity principle. The minimal time required is shown to depend on the metric complexity of the a priori information set. Two notions of n-width (or metric dimension) are introduced to characterize this complexity. In the second part of the paper, the results are applied to systems in which the law governing the evolution of the uncertain elements is not time invariant. Such systems cannot be identified accurately. The inherent uncertainty is bounded in the case of slow time variation. The n-widths and related optimal inputs provide benchmarks for the evaluation of actual inputs occurring in adaptive feedback systems
  • Keywords
    adaptive control; feedback; identification; linear systems; state estimation; time-varying systems; H norms; LTI systems; a priori information set; adaptive feedback systems; identification; l1 norms; linear time invariant systems; metric complexity; metric dimension; monotonicity principle; n-width; optimal worst-case uncertainty; slow time variation; slowly varying systems; uncertainty principles; Adaptive control; Adaptive systems; Control systems; Electric variables measurement; Extraterrestrial measurements; Feedback; Linear systems; Programmable control; Time invariant systems; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/9.317106
  • Filename
    317106