• DocumentCode
    1164852
  • Title

    High-resolution measurement of planar waveguide birefringence using ring resonator

  • Author

    Liu, J. ; Lu, Z. ; Zhang, Z. ; Xiao, G. ; Sun, F.

  • Author_Institution
    Inst. for Microstruct. Sci., Nat. Res. Council of Canada, Ont., Canada
  • Volume
    42
  • Issue
    15
  • fYear
    2006
  • fDate
    7/20/2006 12:00:00 AM
  • Firstpage
    880
  • Lastpage
    881
  • Abstract
    Birefringence measurement of planar silica-on-silicon waveguides with high resolution is proposed and demonstrated using a ring resonator. For the presented waveguide sample, the measured birefringence at 1550 nm was (4.115±0.094)×10-6 at 25.000±0.001°C. The minimum low-level birefringence resolution of 6.266×10-7 was experimentally realised.
  • Keywords
    birefringence; optical planar waveguides; optical resonators; 1550 nm; Si; birefringence measurement; planar waveguide; ring resonator; silica-on-silicon waveguide;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20061327
  • Filename
    1683674
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1164852