Title :
Conference Reports
Author :
Novak, O. ; Kubatova, Hana ; Al-Hashimi, B.M. ; Marinissen, Erik Jan ; Ravikumar, C.P.
fDate :
4/1/2006 12:00:00 AM
Abstract :
Reports from Workshop on System Effects of Logic Soft Errors (SELSE II), IEEE Design and Diagnostics of Electronic Circuits and Systems Workshop (DDECS 06), European Test Symposium (ETS 06), and International Test Conference (ITC 05).
Keywords :
Logic Soft Errors; conference report; Logic Soft Errors; conference report;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2006.91
