DocumentCode :
1165255
Title :
Comparisons between NO2- and O3-sensing properties of phthalocyanines and n-InP thin films in controlled and noncontrolled atmospheres
Author :
Brunet, Jérôme ; Germain, Jean-Paul ; Pauly, Alain ; Blanc, Jean-Pierre
Author_Institution :
Dept. U.F.R. Recherche Scientifique et Tecnique, Aubiere, France
Volume :
4
Issue :
6
fYear :
2004
Firstpage :
735
Lastpage :
742
Abstract :
This paper describes two different semiconductor gas sensors devoted to the detection of oxidizing pollutants in the atmosphere. The first sensor consists of thin films of phthalocyanines as sensing layers (CuPc, ZnF16Pc, and LuPc2) evaporated onto alumina substrate fitted with interdigitated electrodes. The second sensor is realized with a mineral monocrystalline semiconductor: n-doped epitaxial layer grown on a semi-insulating substrate of indium phosphide. Each sensor has been submitted to low-controlled concentrations of ozone and nitrogen dioxide, and their detection characteristics, such as response time, stability, and sensitivity, are described. Comparison of these two sensors shows their complementary sensing characteristics, and NO2 and O3 act in the same way. Measurements under noncontrolled atmosphere (urban air) have been realized and have demonstrated the potentialities of these structures to be used as oxidizing pollutant detectors. Proposed methods to improve the detection of oxidizing species in urban air are discussed.
Keywords :
III-V semiconductors; air pollution measurement; epitaxial growth; gas sensors; indium compounds; nitrogen compounds; oxidation; semiconductor thin films; InP; NO2; O3; alumina substrate; controlled atmosphere; indium phosphide; interdigitated electrodes; monocrystalline semiconductor; n-InP thin films; n-doped epitaxial layer; nitrogen dioxide; noncontrolled atmospheres; oxidizing pollutant detection; ozone; phthalocyanines; pollution measurement; semi-insulating substrate; semiconductor gas sensors; sensing layers; Atmosphere; Electrodes; Epitaxial layers; Gas detectors; Minerals; Pollution; Semiconductor thin films; Sensor phenomena and characterization; Substrates; Thin film sensors; 65; Epitaxial layer; pollution measurement; thin film;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2004.833499
Filename :
1359832
Link To Document :
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